The IMS will have 3 poster presentations on the SAFE 2009 in Veldhoven, Netherlands.
"Investigation of Mechanical Strength of Epitaxially Grown Ultra-Thin Silicon Chips"
A. Kiss, T. Hoang, MemberIEEE, C. Harendt and J.N. Burghartz, FellowIEEE
"Metal ― Porous Silicon Contact and Electrical Resistivity of Porous Silicon"
S. Ferwana, T. Zehender, E. Angelopoulos, C. Harendt, M. Zimmermann and J. Burghartz
"Compact Modeling of CMOS Transistors under Uniaxial Stress"
N. Wacker, M. Hassan, H. Richter, H. Rempp and J.N. Burghartz
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