29th November, 2012, saw the final presentation of the joint project PRONTO µ-Probe at the IMS. The project´s goal was to develop a temperature-controlled test card that will increase the accuracy when testing semiconductors. At IMS silicon steering plates with highly-precise openings for the test needles and heating elements were produced that were then integrated into equally heatable test cards by our project partner Feinmetall. The control and integration of the prober environment was done by Advantest (formerly known as Verigy). This system significantly reduces the test needles´ undesired position shifts during temperature changes. After a requirement analysis with the client further application steps will be planned. Due to the process documentation generated with the PRONTO production platform this can be achieved much easier.
For more information, please refer to https://micro-probe.ims-chips.de